Download Applications of Finite Element Methods for Reliability by Cher Ming Tan, Wei Li, Zhenghao Gan, Yuejin Hou PDF

By Cher Ming Tan, Wei Li, Zhenghao Gan, Yuejin Hou

ISBN-10: 0857293095

ISBN-13: 9780857293091

Applications of Finite aspect equipment for Reliability stories on ULSI Interconnections presents a close description of the appliance of finite aspect tools (FEMs) to the examine of ULSI interconnect reliability. over the last twenty years the applying of FEMs has turn into frequent and maintains to guide to a stronger knowing of reliability physics.

To aid readers focus on the expanding sophistication of FEMs’ functions to interconnect reliability, Applications of Finite aspect tools for Reliability reports on ULSI Interconnections will:

  • introduce the main of FEMs;
  • review numerical modeling of ULSI interconnect reliability;
  • describe the actual mechanism of ULSI interconnect reliability encountered within the electronics undefined; and
  • discuss intimately using FEMs to appreciate and increase ULSI interconnect reliability from either the actual and sensible viewpoint, incorporating the Monte Carlo method.

A full-scale overview of the numerical modeling technique utilized in the research of interconnect reliability highlights necessary and remarkable concepts which were built lately. Many illustrations are used through the booklet to enhance the reader’s figuring out of the technique and its verification. genuine experimental effects and micrographs on ULSI interconnects also are included.

Applications of Finite aspect tools for Reliability reports on ULSI Interconnections is an effective reference for researchers who're engaged on interconnect reliability modeling, in addition to in the event you need to know extra approximately FEMs for reliability functions. It supplies readers a radical realizing of the functions of FEM to reliability modeling and an appreciation of the strengths and weaknesses of assorted numerical versions for interconnect reliability.

Show description

Read or Download Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections PDF

Best quality control books

Error Free Software: Know-How and Know-Why of Program Correctness (Wiley Series in Software Engineering Practice)

Strain to provide high quality software program inside funds leaves little scope to discover the speculation and capability of formal improvement tools. This advent to the production and improvement of software program goals to illustrate quite a few merits to be received through the use of yes options. All innovations defined are in accordance with mathematical foundations, and a easy wisdom of algebra and programming is thought.

The Universal Generating Function in Reliability Analysis and Optimization

Many real-world structures in engineering are composed of multi-state elements that experience assorted functionality degrees and several other failure modes. those affect the full system’s functionality. so much books on reliability idea are dedicated to conventional binary versions that simply enable a procedure both to operate completely or fail thoroughly.

Power Definitions and the Physical Mechanism of Power Flow

Professor Emanuel makes use of transparent presentation to check and facilitate realizing of 2 seminal criteria, The IEEE Std. 1459 and The DIN 40110-2:2002-11. via severe research of crucial and up to date theories and assessment of uncomplicated options, a hugely available advisor to the essence of the factors is gifted.

Statistical Monitoring of Complex Multivariate Processes: With Applications in Industrial Process Control

The improvement and alertness of multivariate statistical recommendations in strategy tracking has received giant curiosity during the last twenty years in academia and alike.  at the beginning constructed for tracking and fault analysis in advanced platforms, such concepts were subtle and utilized in a number of engineering components, for instance mechanical and production, chemical, electric and digital, and tool engineering.

Extra info for Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections

Sample text

J Appl Phys 85:3546 14. Park YJ, Thompson CV (1997) The effects of the stress dependence of atomic diffusivity on stress evolution due to electromigration. J Appl Phys 82:4277 15. edu/emsim/ 16. Hau-Riege CS, Thompson CV (2000) The effects of microstructural transitions at width transitions on interconnect reliability. J Appl Phys 87:8467 17. Hau-Riege SP, Thompson CV (2000) Electromigration saturation in a simple interconnect tree. J Appl Phys 88:2382 18. Hau-Riege SP (2002) Probabilistic immortality of Cu damascene interconnects.

Park YJ, Thompson CV (1997) The effects of the stress dependence of atomic diffusivity on stress evolution due to electromigration. J Appl Phys 82:4277 15. edu/emsim/ 16. Hau-Riege CS, Thompson CV (2000) The effects of microstructural transitions at width transitions on interconnect reliability. J Appl Phys 87:8467 17. Hau-Riege SP, Thompson CV (2000) Electromigration saturation in a simple interconnect tree. J Appl Phys 88:2382 18. Hau-Riege SP (2002) Probabilistic immortality of Cu damascene interconnects.

For instance, via barrier layer cracking is reported by Paik et al. [56] Fig. 14 Stabilized stress– temperature response for passivated Cu films of various thicknesses. Reprinted from Shen and Ramamurty [90], copyright Ó 2003, with permission from Elsevier 34 2 Physics-Based Modeling for ULSI Interconnections Failure Mechanisms in low-k interconnect due to the high von Mises stress at via region. In fact, owing to the reduced fracture energy of the low-k materials [87], dielectric failure is becoming important for nano-interconnects with low-k dielectric [88].

Download PDF sample

Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections by Cher Ming Tan, Wei Li, Zhenghao Gan, Yuejin Hou


by Thomas
4.3

Rated 4.07 of 5 – based on 31 votes